Δημοσιεύσεις μελών--ΣΤΕΦ--Τμήμα Ηλεκτρονικών Μηχανικών, 2014The paper presents the comparison of waveforms for the input stimulus of a circuit under test, using a testing system incorporated in an FPGA, relying on a method based on wavelet transformation of the supply current or load current waveforms. The method differentiates due to the incorporation of different signal inputs according to the needs of the tester and the specifications of the circuit. This is a distinctive and effective method that offers a single-point test measurement solution and may easily be adapted to test various other analog and mixed-signal systems. Experimental results are presented showing the effectiveness of the proposed testing scheme

The paper describes the design and implementation of a circuit testing system which has been incorporated into a prototype using FPGAs. The effectiveness of the prototype testing system has been evaluated by applying a test method for analog and digital (mixed-signal) circuits using wavelets and the results are heartening. The operability and efficiency of the system on a technical level is verified in the field. The new fault testing system incorporates reconfigurability and automated input stimulus selection.