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Demands of the plasma processing industry gradually lead to an increase in electrode areas and driving frequency of the commonly used capacitively coupled reactors. This brings about new phenomena which differ from the well known physics of smaller capacitively coupled plasma (CCP) devices. In this work we compare experimental data and results of numerical modeling for a large CCP discharge having a GEC celllike geometry currently studied in context of a possible use as a sputtering device. Using an electrostatic implicit particlein cell code with MonteCarlo collisions (PIC/MCC), we have been capable of reproducing all main features of the experimental discharges, which have strong relevance for the processing applications, such as the plasma uniformity and the selfbias. The side chamber proves to play an essential role in defining the physics of the whole device, featuring substantial production of plasma particles and participating in establishing the selfbias due to the telegraph effect observed for higher frequencies.

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This paper discusses plasma probe diagnostics, namely the multipole resonance probe (MRP) and Langmuir probe (LP), operated in depositing plasmas. The aim of this work is to show that the combination of both probes provides stable and robust measurements and clear determination of plasma parameters for metallic and ceramic coating processes. The probes use different approaches to determine plasma parameters, e.g. electron density n e and electron temperature T e . The LP is a well-established plasma diagnostic, and its applicability in technological plasmas is well documented. The LP is a dc probe that performs a voltage sweep and analyses the measured current, which makes it insensitive against conductive metallic coating. However, once the LP is dielectrically coated with a ceramic film, its functionality is constricted. In contrast, the MRP was recently presented as a monitoring tool, which is insensitive to coating with dielectric ceramics. It is a new plasma diagnostic based on the concept of active plasma resonance spectroscopy, which uses the universal characteristic of all plasmas to resonate on or near the electron plasma frequency. The MRP emits a frequency sweep and the absorption of the signal, the |S 11 | parameter, is analysed. Since the MRP concept is based on electromagnetic waves, which are able to transmit dielectrics, it is insensitive to dielectric coatings. But once the MRP is metallized with a thin conductive film, no undisturbed RF-signal can be emitted into the plasma, which leads to falsified plasma parameter.In order to compare both systems, during metallic or dielectric coating, the probes are operated in a magnetron CCP, which is equipped with a titanium target. We present measurements in metallic and dielectric coating processes with both probes and elaborate advantages and problems of each probe operated in each coating environment.