No abstract

No abstract

In the process of optimizing solar cells, a quantitative and depth-resolved elemental analysis of photovoltaic thin films is strongly required. Regarding Cu(In,Ga)Se 2 (CIGS) thin film solar cells, depth-dependent stoichometric changes of Ga and In are of great interest because the In/Ga ratio has a large effect on solar cell efficiencies. In this paper, we investigate the elemental composition of CIGS thin film solar cells based on secondary ion intensities in time-of-flight secondary ion mass spectrometry (ToF-SIMS) depth profiling, providing high sensitivities and high spatial resolution. Quantification of the data is obtained by comparison to X-ray photoelectron spectroscopy depth profiles. The detection of MCs + clusters is used for semiquantitative elemental analysis of CIGS thin films. Correlation plots of the intensities of GaCs + and InCs + indicate that there is no relevant matrix effect for In and Ga due to changes in stoichiometry in the layer. Additional high-resolution inductively coupled plasma mass spectrometry measurements show a strong correlation between the ratio of the bulk concentrations of Ga and In and the ratio of integrated ToF-SIMS intensities of GaCs + and InCs + therefore supporting the quantitative interpretation of MCs + data.

Fluoride‐containing bioactive glasses and glass‐ceramics in the SiO2‐P2O5‐CaO‐CaF2 system are of great interest for dental applications, where the precipitation of fluorapatite supports tooth remineralization. Fluorine quantification in those glasses is key to estimate thermal properties and crystallization tendency. This work presents a study on fluorine determination by laser induced breakdown spectroscopy (LIBS) in four melt‐derived glass powders with varying P2O5 concentrations. LIBS enables fluorine quantification with a reduced analysis time, minimal to no sample preparation, and high spatial resolution. The fluorine calibration curve was obtained from CaF2 and SiO2 mixtures as reference samples, and the fluorine loss upon glass melting has been determined as a function of P2O5 content. The P2O5‐free glass shows the lowest fluorine loss (13%), with HF volatilization likely being responsible for the loss. By contrast, the glass with the highest P2O5 content (11.33 wt%) exhibits the largest fluorine loss (55%), owing to additional mechanisms involving the volatilization of phosphorus species like POF3.

No abstract