The Chandra Source Catalog (CSC) is a general purpose virtual X-ray astrophysics facility that provides access to a carefully selected set of generally useful quantities for individual X-ray sources, and is designed to satisfy the needs of a broad-based group of scientists, including those who may be less familiar with astronomical data analysis in the X-ray regime. The first release of the CSC includes information about 94,676 distinct X-ray sources detected in a subset of public Advanced CCD Imaging Spectrometer imaging observations from roughly the first eight years of the Chandra mission. This release of the catalog includes point and compact sources with observed spatial extents 30. The catalog (1) provides access to the best estimates of the X-ray source properties for detected sources, with good scientific fidelity, and directly supports scientific analysis using the individual source data; (2) facilitates analysis of a wide range of statistical properties for classes of X-ray sources; and (3) provides efficient access to calibrated observational data and ancillary data products for individual X-ray sources, so that users can perform detailed further analysis using existing tools. The catalog includes real X-ray sources detected with flux estimates that are at least 3 times their estimated 1σ uncertainties in at least one energy band, while maintaining the number of spurious sources at a level of 1 false source per field for a 100 ks observation. For each detected source, the CSC provides commonly tabulated quantities, including source position, extent, multi-band fluxes, hardness ratios, and variability statistics, derived from the observations in which the source is detected. In addition to these traditional catalog elements, for each X-ray source the CSC includes an extensive set of file-based data products that can be manipulated interactively, including source images, event lists, light curves, and spectra from each observation in which a source is detected.

The ever-increasing quality and complexity of astronomical data underscores the need for new and powerful data analysis applications. This need has led to the development of Sherpa, a modeling and fitting program in the CIAO software package that enables the analysis of multi-dimensional, multi-wavelength data. In this paper, we present an overview of Sherpa's features, which include: support for a wide variety of input and output data formats, including the new Model Descriptor List (MDL) format; a model language which permits the construction of arbitrarily complex model expressions, including ones representing instrument characteristics; a wide variety of fit statistics and methods of optimization, model comparison, and parameter estimation; multi-dimensional visualization, provided by ChIPS; and new interactive analysis capabilities provided by embedding the S-Lang interpreted scripting language. We conclude by showing example Sherpa analysis sessions.

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The first release of the Chandra Source Catalog (CSC) contains ∼95,000 X-ray sources in a total area of 0.75% of the entire sky, using data from ∼3900 separate ACIS observations of a multitude of different types of X-ray sources. In order to maximize the scientific benefit of such a large, heterogeneous data set, careful characterization of the statistical properties of the catalog, i.e., completeness, sensitivity, false source rate, and accuracy of source properties, is required. Characterization efforts of other large Chandra catalogs, such as the ChaMP Point Source Catalog or the 2 Mega-second Deep Field Surveys, while informative, cannot serve this purpose, since the CSC analysis procedures are significantly different and the range of allowable data is much less restrictive. We describe here the characterization process for the CSC. This process includes both a comparison of real CSC results with those of other, deeper Chandra catalogs of the same targets and extensive simulations of blank-sky and point-source populations.

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