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This paper presents an efficient approach to testing on-chip Analog to Digital Converters (ADCs) and Digital to Analog Converters (DACs) in loop-back mode. On-chip digital signal processing units can be used to generate stimuli. With this methodology, go/no-go tests as well as characterization of the individual ADCs and DACs are possible. The proposed approach is simple and overcomes the low parametric fault coverage of conventional loop-back tests. Simulations on a Matlab model of loopbacked converters are presented to validate the feasibility of the method.

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