Scanning transmission electron microscopy (STEM) has been successfully utilized to investigate atomic structure and chemistry of materials with atomic resolution. However, STEM’s focused electron probe with a high current density causes the electron beam damages including radiolysis and knock-on damage when the focused probe is exposed onto the electron-beam sensitive materials. Therefore, it is highly desirable to decrease the electron dose used in STEM for the investigation of biological/organic molecules, soft materials and nanomaterials in general. With the recent emergence of novel sparse signal processing theories, such as compressive sensing and model-based iterative reconstruction, possibilities of operating STEM under a sparse acquisition scheme to reduce the electron dose have been opened up. In this paper, we report our recent approach to implement a sparse acquisition in STEM mode executed by a random sparse-scan and a signal processing algorithm called model-based iterative reconstruction (MBIR). In this method, a small portion, such as 5% of randomly chosen unit sampling areas (i.e. electron probe positions), which corresponds to pixels of a STEM image, within the region of interest (ROI) of the specimen are scanned with an electron probe to obtain a sparse image. Sparse images are then reconstructed using the MBIR inpainting algorithm to produce an image of the specimen at the original resolution that is consistent with an image obtained using conventional scanning methods. Experimental results for down to 5% sampling show consistency with the full STEM image acquired by the conventional scanning method. Although, practical limitations of the conventional STEM instruments, such as internal delays of the STEM control electronics and the continuous electron gun emission, currently hinder to achieve the full potential of the sparse acquisition STEM in realizing the low dose imaging condition required for the investigation of beam-sensitive materials, the results obtained in our experiments demonstrate the sparse acquisition STEM imaging is potentially capable of reducing the electron dose by at least 20 times expanding the frontiers of our characterization capabilities for investigation of biological/organic molecules, polymers, soft materials and nanostructures in general.

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3D replicas of sunflower pollen microparticles, comprised of a multicomponent magnetic spinel ferrite (CoFeO) with tailorable adhesive properties, have been synthesized for the first time via a conformal layer-by-layer (LbL) surface sol-gel (SSG) deposition process followed by organic pyrolysis and oxide compound formation at a peak temperature of 600 °C-900 °C. These high-fidelity ferrite pollen replicas exhibited multimodal (van der Waals, vdW, and magnetic) adhesion that could be tuned via control of the CoFeO nanoparticle and crystal sizes. The CoFeO pollen replicas exhibited a non-monotonic change in short-range (~10 nm) vdW adhesion with an increase in the peak firing temperature, which was consistent with the counteracting effects of particle coarsening on the size and number of nanoparticles present on the sharp tips of the echini (spines) on the pollen replica surfaces. The longer-range (up to ~1 mm) magnetic force of adhesion increased monotonically with an increase in firing temperature, which was consistent with the observed increases in the values of the saturation and remanent magnetization of CoFeO with an increase in average nanocrystal size. By adjusting the nanocrystal/nanoparticle sizes of the CoFeO pollen replicas, the total force of adhesion (vdW  +  magnetic) to a magnetic substrate could be increased by a factor of ~3 relative to native pollen grains.

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A molecular beam epitaxy (MBE) system specifically designed for growing Hg-based films and multilayer structures is described. It consists of a preparation and analysis chamber, a main MBE chamber equipped with a refillable Hg source, and a load lock for introducing and retrieving samples from either chamber. The system has been used to grow CdTe, HgCdTe, and HgTe films as well as HgTe–CdTe superlattices. The optical, electrical, and structural properties of the films and multilayers are discussed.