No abstract

Yield loss associated with leakage screens is increasing as products migrate to technologies with thinner gate oxide and more aggressive lithography. Product competitiveness requires meeting low power and when products have exhausted design options, tighter than 3 sigma fast leakage screens are implemented to reduce power which can result in significant yield loss.Selective Voltage Binning (SVB) provides a way to interlock a lower operating voltage in the system with process window information so that faster parts can be run in the system at a lower voltage avoiding the yield loss associated with custom leakage screens

A systematic method is proposed to address modeling challenges in accurate chip level leakage prediction, namely a precise total leakage width count method, a simple model to quantify leakage uplift caused by systematic across-chip variation, and a consistent model to capture 3-sigma leakage and leakage spread at fixed performance.

No abstract