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Abstract. 2014 The Atomic Force Microscopies used in Resonant mode is a powerful tool to measure local surface properties: for example, the quantitative analysis of the electrical forces induced by the application of an electrical tension between a conductive microscope tip and a forwards surface in front allows the determination of the tip/surface capacitance and of the local surface work function. However, this analysis needs a well adapted model for each type of surface. In this paper, we calculate, with a simple geometrical model, the tip-surface interaction between a metallic tip and a semiconducting surface and we describe its variations with the applied tension and the tip/surface distance.

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