Evaluation of the capacitive force between an atomic force microscopy tip and a metallic surface

Hudlet, Sylvain; Jean, M.; Guthmann, C.; Berger, Julien

doi:10.1007/s100510050219

Cited by 320 publications

(258 citation statements)

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“…Hao et al [221] derived an equation for a conical tip of small opening angle. It is not identical to the equation of Hudlet et al [218] but the difference is small. Both use a uniformly charged line model and find a logarithmic distance dependency, which is confirmed by Yokoyama et al [224].…”

Section: Electrostatic Forcementioning

confidence: 60%

See 1 more Smart Citation

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,245

2,949

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Section: Electrostatic Forcementioning

confidence: 60%

“…The most general approximation is that for a conical tip of half opening angle Q with a spherical apex of radius R (Fig. 15) given by Hudlet et al [218]. It was extended by Law and Rieutord [219] to take also the cantilever into account.…”

Section: Electrostatic Forcementioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,245

2,949

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“…KPFM is a method working in combination with nc-AFM and which is based on the minimization of the electrostatic interaction between the tip and the sample. Electrostatic tip-sample interactions have been widely studied in the long-range regime on the experimental and on the theoretical level [23][24][25][26][27][28][29] within the frame of nc-AFM and KPFM [30][31][32][33][34] . Long-range electrostatic forces cause capacitive forces connected to the capacitance of the tip/counter-electrode capacitor as well as Coulombic forces connected to the presence of charges within it.…”

Section: Introductionmentioning

confidence: 99%

Polarization effects in noncontact atomic force microscopy: A key to model the tip-sample interaction above charged adatoms

2011

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We discuss the influence of short-range electrostatic forces, so called dipolar forces, between the tip of an atomic force microscope (AFM) and a surface carrying charged adatoms. Dipolar forces are of microscopic character and have their origin in the polarizability of the foremost atoms on tip and surface. In most experiments performed by non-contact AFM, other forces such as binding forces dominate the interaction. However, in the experiments presented by Gross et al. [Science 324, 1428[Science 324, (2009, where the charge state of individual gold atoms adsorbed on a thin dielectric layer was determined, binding forces are negligible as the tip-sample distance is relatively large.We develop a model which mimics the experimental tip-sample geometry of the aforementioned experiments. The model includes van der Waals and long-range electrostatic interactions, as well as the short-range electrostatic interaction based on the self-consistent description of electronic polarization effects on neutral and charged adatoms. The model is based on a calculation of the electrostatic energy of the tip-sample geometry.Our calculations of non-contact AFM imaging as well as of bias spectroscopic curves are in good agreement with the experimental ones presented by Gross et al. It is demonstrated that the short-range dipolar force is mainly responsible for the contrast observed in topography imaging above charged species. However, it is the long-range capacitive force which is responsible for the detection of the charge state in bias spectroscopy. We discuss implications of our findings on future experiments which aim to detect single charges by means of Kelvin probe force microscopy.

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“…We describe the long-range part of the electrostatic force F cap as the force between two electrodes of a capacitor, one of which is planar and represents the surface and other one is spherical and represents the tip [38]. The same geometry, that is the same tip radius and distance from the surface, is assumed as in the Hamaker model used above.…”

Section: A Forcesmentioning

confidence: 99%

Charge-state dynamics in electrostatic force spectroscopy

Ondráček

Hapala²,

Jelı́nek³

2016

Nanotechnology

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We present a numerical model which allows us to study the Kelvin force probe microscopy response to the charge switching in quantum dots at various time scales. The model provides more insight into the behavior of frequency shift and dissipated energy under different scanning conditions measuring a temporarily charged quantum dot on surface. Namely, we analyze the dependence of the frequency shift, its fluctuation and of the dissipated energy, on the resonance frequency of tip and electron tunneling rates between tip-quantum dot and quantum dot-sample. We discuss two complementary approaches to simulating the charge dynamics, a stochastic and a deterministic one. In addition, we derive analytic formulas valid for small amplitudes, describing relations between the frequency shift, dissipated energy, and the characteristic rates driving the charging and discharging processes.

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Evaluation of the capacitive force between an atomic force microscopy tip and a metallic surface

Cited by 320 publications

References 0 publications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Polarization effects in noncontact atomic force microscopy: A key to model the tip-sample interaction above charged adatoms

Charge-state dynamics in electrostatic force spectroscopy

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