A concept to integrate a thin-film radio-frequency noise suppressor in a transmission line is demonstrated by using Co 85 Nb 12 Zr 3 amorphous film with the microwire array structure. The ferromagnetic resonance loss generation at high frequencies is essential to realize this idea. The degree of noise suppression is only less than 1 dB, which should be improved by optimum design to integrate the magnetic film.

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In this paper, the X-ray diffraction profiles of multilayer with uncorrelated rough interfaces are directly simulated using kinematic theory of X-ray diffraction. The result shows that the decrease of the reflective intensity caused by the interfacial roughness is more severe than that caused by random fluctuation of period of the same degree, and the decrease of the reflective intensity of high order Bragg deffraction is more rapid than that of low order ones. So it is very important to reduce the interfacial roughness in the deposition and in the annealing of multilayer films.

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