This article describes the Boolean satisfiability method for generating test patterns for single stuck-at faults in combinational circuits. This new method generates test patterns in two steps: First, it constructs a formula expressing the Boolean diference between the unfaulted and faulted circuits. Second, it applies a Boolean satisjiability algorithm to the resulting formula. This approach differs from previous methods now in use, which search the circuit structure directly instead of constructing a formula from it. The new method is general and effective: it allows for the addition of heuristics used by structural search methods, and it has produced excellent results on popular test pattern generation benchmarks.

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