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The emission of intermediate mass fragments (IMFs) produced in the inclusive 12 C+ 27 Al and 27 Al+ 12 C reactions at incident energies corresponding to a c.m. excitation energy of 107.5 MeV were studied at lab. angles of 12 • to 25 • . Double differential cross sections of the IMF spectra are compared to model calculations, which include direct breakup of both the projectile and target, nucleon coalescence, as well as partial and complete fusion. This study indicates the importance of the complementary nature of a reaction together with its inverse process in fully understanding the driving reaction mechanisms in the interaction of two light-mass nuclei.

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Nanocrystalline materials are quite promising in the fabrication of photovoltaic devices because of their advantages over conventional polycrystalline and amorphous materials. Also, nanocrystalline materials have great potential for technological applications. This paper discusses how nanocrystalline semiconductors were characterized structurally using X-ray Diffraction (XRD) and Scanning Electron Microscopy (SEM). Further investigations of the deposited layers included the elemental analysis using EnergyDispersive X-Ray (EDXR). The results obtained revealed that the nc-Si is polycrystalline in nature with the grain size of ≤ 100 nm. The elemental analysis reveal that the indium tin oxide consists of Sn 35 wt%, Si 15.54 wt%, In 11.84 wt% and Al 11.74 wt%. The XRD results are found to be consistent with EDXR results. The photovoltaic application of the deposited layer is discussed.