Using neutron reflectometry and resonant x-ray techniques we studied the magnetic proximity effect (MPE) in superlattices composed of superconducting YBa2Cu3O7 and ferromagnetic-metallic La0.67Ca0.33MnO3 or ferromagnetic-insulating LaMnO(3+δ). We find that the MPE strongly depends on the electronic state of the manganite layers, being pronounced for the ferromagnetic-metallic La0.67Ca0.33MnO3 and almost absent for ferromagnetic-insulating LaMnO(3+δ). We also detail the change of the magnetic depth profile due to the MPE and provide evidence for its intrinsic nature.

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We studied the optical properties of as-prepared (amorphous) and thermally crystallized (fcc) flash evaporated Ge2Sb2Te5 thin films using variable angle spectroscopic ellipsometry in the photon energy range 0.54–4.13 eV. We employed Tauc–Lorentz (TL) model and Cody–Lorentz (CL) model for amorphous phase and TL model with one additional Gaussian oscillator for fcc phase data analysis. The amorphous phase has optical bandgap energy Egopt=0.65 eV (TL) or 0.63 eV (CL) slightly dependent on used model. The Urbach edge of amorphous thin film was found to be ∼70 meV. Both models behave very similarly and accurately fit to the experimental data at energies above 1 eV. The CL model is more accurate in describing dielectric function in the absorption onset region. The thickness decreases ∼7% toward fcc phase. The bandgap energy of fcc phase is significantly lower than amorphous phase, Egopt=0.53 eV. The temperature dependent ellipsometry revealed crystallization in the range 130–150 °C. The bandgap energy of amorphous phase possesses temperature redshift −0.57 meV/K (30–110 °C). The crystalline phase has more complex bandgap energy shift, first +0.62 meV/K (150–180 °C) followed by −0.29 meV/K (190–220 °C). The optical properties (refractive index, extinction coefficient, and optical bandgap energy) of as-prepared and fcc flash evaporated Ge2Sb2Te5 thin films are very similar to those values previously reported for sputtered thin films.