We investigated an integrated optical modulator consisting of two Mach-Zehnder interferometers. The modulator can generate optical signals in various types of modulation formats, which have advantages for long-haul transmission, optical labeling, etc. By using a fabricated versatile optical modulator having traveling-wave electrodes designed for high-speed signals, we demonstrated generation of optical 40Gb/s frequency-shift-keying signals, which can be demodulated by an optical filter. 80Gb/s optical differential quadrature-shift-keying modulation was also demonstrated, where 40Gb/s in-phase and quadrature data were, simultaneously, fed to the modulator.
The crystal structures of GeSb(6)Te(10) and GeBi(6)Te(10) were scrutinized using an X-ray powder diffraction method, which revealed that these compounds crystallize in trigonally distorted cubic close-packed structures with a 51-layer period (R3m). Each layer consists of a triangular atomic net; Te atoms occupy their own specific layers, whereas Ge, Sb and Bi atoms are located in the other layers. In these pseudobinary compounds, random atomic occupations of Ge and Sb/Bi are observed and the layers form two kinds of elemental structural blocks by their successive stacking along the c axis. These compounds can be presumed to be isostructural. It is known that the chemical formula of the chalcogenide compounds with the homologous structures found in these pseudobinary systems can be written as (GeTe)(n)(Sb(2)Te(3))(m) or (GeTe)(n)(Bi(2)Te(3))(m) (n, m: integer); the GeSb(6)Te(10) and GeBi(6)Te(10) investigated in this study, which correspond to the case in which n = 1 and m = 3, naturally have 3 x l = 51-layer structures according to a formation rule l = 2n + 5m commonly found in the compounds of these chalcogenide systems (l represents the number of layers in the basic structural unit). Calculations based on the density functional theory revealed that these materials are compound semiconductors with very narrow band gaps.
The crystallization of a sputtered Sb(8)Te(3) film was examined in an X-ray powder diffraction experiment. An as-sputtered, amorphous Sb(8)Te(3) film crystallized during heating into a structure of Sb-Te homologous series modulated along the stacking direction. During heating the lattice parameters and the modulation period γ were found to change significantly and continuously; this observation suggests a continuous change in the stacking sequence. A superspace analysis revealed that with heating the modulation period γ increased to a value that seemed to be determined by the atomic composition. Once γ reached this value it remained unchanged with cooling. A three-dimensional projection of the converged four-dimensional superspace structure corresponded to the homologous Sb(8)Te(3) structure.
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