The XIS is an X-ray Imaging Spectrometer system, consisting of state-of-the-art charge-coupled devices (CCDs) optimized for X-ray detection, camera bodies, and control electronics. Four sets of XIS sensors are placed at the focal planes of the grazing-incidence, nested thin-foil mirrors (XRT: X-Ray Telescope) onboard the Suzaku satellite. Three of the XIS sensors have front-illuminated CCDs, while the other has a back-illuminated CCD. Coupled with the XRT, the energy range of 0.2-12 keV with energy resolution of 130 eV at 5.9 keV, and a field of view of 18 × 18 are realized. Since the Suzaku launch on 2005 July 10, the XIS has been functioning well.

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Space-borne astronomical instruments require extensive characterization on the ground before launch. In the hard X-ray region however, it is difficult for a laboratory-based beamline using a conventional X-ray source to provide a capability sufficient for pre-flight high-precision calibration. In this paper, we describe an experiment to characterize a hard X-ray telescope at a synchrotron facility, mainly on the basis of experimental setup and examples of measured results. We have developed hard X-ray telescopes consisting of Wolter-I grazing incidence optics and platinum-carbon multilayer supermirror coatings. The telescopes have been characterized at the synchrotron facility SPring-8 beamline BL20B2. The measurements at BL20B2 have great advantages such as extremely high flux, large-sized and less-divergent beam, and monochromatic beam covering the entire hard X-ray region from 8 to over 100 keV. The telescope was illuminated by monochromatic hard X-rays, and the focused image was measured by high resolution hard X-ray imagers. The entire telescope aperture was mapped by a small beam, and the effective area and the point spread function were obtained as well as local optical properties for further diagnostics of the characteristics of the telescope.

A charge-injection technique is applied to the X-ray CCD camera, XIS (X-ray Imaging Spectrometer) aboard Suzaku. The charge transfer inefficiency (CTI) in each CCD column (vertical transfer channel) is measured by the injection of charge packets into a transfer channel and subsequent readout. This paper reports on the performances of the charge-injection capability based on the ground experiments using a radiation-damaged device, and in-orbit measurements of the XIS. The ground experiments show that charges are stably injected with a dispersion of 91eV in FWHM in a specific column for the charges equivalent to an X-ray energy of 5.1keV. This dispersion width is significantly smaller than that of the X-ray events of 113eV (FWHM) at approximately the same energy. The amount of charge loss during transfer in a specific column, which is measured with the charge-injection capability, is consistent with that measured with the calibration source. These results indicate that the charge-injection technique can accurately measure column-dependent charge losses, rather than the calibration sources. The column-to-column CTI correction to the calibration source spectra significantly reduces the line widths compared to those with a column-averaged CTI correction (from 193eV to 173eV in FWHM on an average at the time of one year after the launch). In addition, this method significantly reduces the low-energy tail in the line profile of the calibration source spectrum.