In some methods for test generation, an analog device under test (DUT) is treated as a discrete-time digital system by placing it between a digital-to-analog converter and an analog-to-digital converter. Then the test patterns and responses can be performed and analyzed in the digital domain. We propose a novel test generation algorithm based on a support vector machine (SVM). This method uses test patterns derived from the test generation algorithm as input stimuli, and sampled output responses of the analog DUT for classification and fault detection. The SVM is used for classification of the response space. When the responses of normal circuits are similar to those of faulty circuits (i.e., the latter have only small parametric faults), the response space is mixed and traditional algorithms have difficulty in distinguishing the two groups. However, the SVM provides an effective result. This paper also proposes an algorithm to calculate the test sequence for input stimuli using the SVM results. Numerical experiments prove that this algorithm can enhance the precision of test generation.

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Many methods have been presented for the testing and diagnosis of analog circuits. Each of these methods has its advantages and disadvantages. In this paper we propose a novel sensitivity analysis algorithm for the classical parameter identification method and a continuous fault model for the modern test generation algorithm, and we compare the characteristics of these methods. At present, parameter identification based on the component connection model (CCM) cannot ensure that the diagnostic equation is optimal. The sensitivity analysis algorithm proposed in this paper can choose the optimal set of trees to construct an optimal CCM diagnostic equation, and enhance the diagnostic precision. But nowadays increasing attention is being paid to test generation algorithms. Most test generation algorithms use a single value in the fault model. But the single values cannot substitute for the actual faults that may occur, because the possible faulty values vary over a continuous range. To solve this problem, this paper presents a continuous fault model for the test generation algorithm which has a continuous range of parameters. The test generation algorithm with this model can improve the treatment of the tolerance problem, including the tolerances of both normal and faulty parameters, and enhance the fault coverage rate. The two methods can be applied in different situations.

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