Translucent objects pose a difficult problem for traditional structured light 3D scanning techniques. Subsurface scattering corrupts the range estimation in two ways: by drastically reducing the signal-to-noise ratio and by shifting the intensity peak beneath the surface to a point which does not coincide with the point of incidence. In this paper we analyze and compare two descattering methods in order to obtain reliable 3D coordinates for translucent objects. By using polarization-difference imaging, subsurface scattering can be filtered out because multiple scattering randomizes the polarization direction of light while the surface reflectance partially keeps the polarization direction of the illumination. The descattered reflectance can be used for reliable 3D reconstruction using traditional optical 3D scanning techniques, such as structured light. Phase-shifting is another effective descattering technique if the frequency of the projected pattern is sufficiently high. We demonstrate the performance of these two techniques and the combination of them on scanning real-world translucent objects.

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This paper presents a novel method for estimating specular roughness and tangent vectors, per surface point, from polarized second order spherical gradient illumination patterns. We demonstrate that for isotropic BRDFs, only three second order spherical gradients are sufficient to robustly estimate spatially varying specular roughness. For anisotropic BRDFs, an additional two measurements yield specular roughness and tangent vectors per surface point. We verify our approach with different illumination configurations which project both discrete and continuous fields of gradient illumination. Our technique provides a direct estimate of the per-pixel specular roughness and thus does not require off-line numerical optimization that is typical for the measure-and-fit approach to classical BRDF modeling.

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Figure 1: Renderings under environmental illumination of subjects with spatially varying reflectance acquired using circularly polarized spherical illumination. AbstractWe present a novel method for surface reflectometry from a few observations of a scene under a single uniform spherical field of circularly polarized illumination. The method is based on a novel analysis of the Stokes reflectance field of circularly polarized spherical illumination and yields per-pixel estimates of diffuse albedo, specular albedo, index of refraction, and specular roughness of isotropic BRDFs. To infer these reflectance parameters, we measure the Stokes parameters of the reflected light at each pixel by taking four photographs of the scene, consisting of three photographs with differently oriented linear polarizers in front of the camera, and one additional photograph with a circular polarizer. The method only assumes knowledge of surface orientation, for which we make a few additional photometric measurements. We verify our method with three different lighting setups, ranging from specialized to off-theshelf hardware, which project either discrete or continuous fields of spherical illumination. Our technique offers several benefits: it estimates a more detailed model of per-pixel surface reflectance parameters than previous work, it requires a relatively small number of measurements, it is applicable to a wide range of material types, and it is completely viewpoint independent.