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Cobalt-tungsten thin films, 300–500 Å thick, containing 0–15 at. % (0–35 wt. %) tungsten have been prepared by electrodeposition onto polycrystalline copper substrates, from acidic and basic baths of various compositions, at 22, 50, and 90 °C. The grain morphology, phase composition, texture, and defect structure were studied by transmission electron microscopy and diffraction. The deposits were either amorphous (or composed of microcrystallites) or crystalline, depending on the plating conditions. The crystalline films consisted of a dispersion of large grains (≫film thickness) within a background of small size grains (≲film thickness). The crystal structure of the latter was hcp, fcc, or mixed. The hexagonal small grains showed a varying degree of [0001] texture. The large grains consisted of alternate hcp and fcc platelets with a definite mutual orientation relationship: (0001)h∥(001)c∥ substrate surface with [101̄0]h∥[110]c or (0001)h∥(111)c∥ substrate surface with [21̄1̄0]h∥[110]c. The grains of both phases contained extensive stacking faults. The microstructure of the films is discussed and a growth mechanism is proposed in order to account, in terms of mutual epitaxy, for the observed orientation relationship between the hcp and fcc structures.

Physical, chemical, and isotopic analyses of individual radioactive and other particles in the micron-size range, key tools in environmental research and in nuclear forensics, require the ability to precisely relocate particles of interest (POIs) in the secondary ion mass spectrometer (SIMS) or in another instrument, after having been located, identified, and characterized in the scanning electron microscope (SEM). This article describes the implementation, testing, and evaluation of the triangulation POIs re-location method, based on microscopic reference marks imprinted on or attached to the sample holder, serving as an inherent coordinate system. In SEM-to-SEM and SEM-to-SIMS experiments re-location precision better than 10 microm and 20 microm, respectively, is readily attainable for instruments using standard specimen stages. The method is fast, easy to apply, and facilitates repeated analyses of individual particles in different instruments and laboratories.

The following shows the correction to Equation (3) that appeared on page 356 of Microscopy and Microanalysis, 11:4, August 2005, in the article by Admon et al. The lines, highlighted with gray screen, were inadvertently left out.

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