Abstract-In this paper, we study the impact of recent scaling trends on device degradation effects as well as their impact on microarchitecture. A new binning strategy is proposed that takes into account the individual degradation of the processing nodes. The vitality of each processing node is derived from its dutycycle. By means of random sampling and statistical analysis, the duty-cycle is captured in a resource and time efficient way so that it is feasible to observe more than 100 processing nodes with a single sampling unit. Applications of this kind of degradation handling can primarily be found where conventional reliability verification and life-test acceleration techniques such as burn-in cannot be used anymore due to their complexity and inherent constraints.