Because Raman spectroscopy has high discrimination for glucose, a data set of practical dimensions appears to be sufficient for universal calibration. Improvements based on reducing the variance of blood perfusion are expected to reduce the prediction errors substantially, and the inclusion of supplementary calibration points for the wearable device under development will be permissible and beneficial.

The reciprocal space structures of Si backside rough surfaces were studied using an in-plane light scattering technique. A diode array detector was used to collect the angular distribution of the scattered intensity. The diffraction profiles are interpreted based on the theory of diffraction from a self-affine rough surface. Roughness parameters such as interface width, lateral correlation length, and the roughness exponent, are extracted from the profiles and are compared to that obtained by real space imaging techniques such as atomic force microscopy and stylus profilometry. Factors that limit the accuracy of light scattering measurements are discussed.

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