We report an experimental proof of principle for ghost imaging in the hard x-ray energy range. We used a synchrotron x-ray beam that was split using a thin crystal in Laue diffraction geometry. With an ultra-fast imaging camera, we were able to image x-rays generated by isolated electron bunches. At this time scale, the shot noise of the synchrotron emission process is measurable as speckles, leading to speckle correlation between the two beams. The integrated transmitted intensity from a sample located in the first beam was correlated with the spatially resolved intensity measured in the second, empty, beam to retrieve the shadow of the sample. The demonstration of ghost imaging with hard x-rays may open the way to protocols to reduce radiation damage in medical imaging and in non-destructive structural characterization using Free Electron Lasers.Ghost imaging, in its basic form, is the technique of indirectly imaging a sample by using the correlation between the intensity recorded at two detectors illuminated by spatially separated correlated beams [1]. A bucket detector measures the total intensity transmitted (or scattered) by a sample, placed in one of the beams. The sample image is then retrieved by correlating the output of the bucket detector with a pixel array detector located in the other beam, namely the one that has not directly interacted with the sample. Initially demonstrated with entangled photon pairs [2], ghost imaging was subsequently performed using correlation between classical coherent light beams [3]. The protocol was shown to be very robust, leading to experimental studies on ghost imaging using pseudo-thermal light [4][5][6], true thermal sources [7], and eventually computational ghost imaging [8], where a computer-controlled spatial light modulator generates a series of known illuminating fields, altogether removing the need for imaging the empty beam. Of relevance for this paper is also a very recent demonstration of Fourier transform ghost imaging using speckle fields generated with partially coherent synchrotron x-rays [9]. At the heart of thermal ghost imaging is the speckle correlation in the intensity fluctuations of the illuminating beam. The speckles can be produced either by nearfield diffraction of a coherent beam by a slowly moving diffracting object [4-6, 9], or taking advantage of the natural fluctuations of true thermal light [7], as in the Hanbury Brown-Twiss (intensity) interferometer [10]. In this Letter we use the latter mechanism to produce the first proof of principle demonstration of hard x-ray direct ghost imaging using synchrotron emission from an undulator in a third generation synchrotron storage ring. Synchrotron emission from an ultra-relativistic electron bunch provides a natural thermal source of hard x-rays. Intensity correlation x-ray experiments, proposed as far back as 1975 [11] (see also [12]), were employed several times for coherence characterization of synchrotron [13][14][15] and x-ray Free Electron Laser (FEL) [16] beams. To date though, x-ray spec...

International audienceNucleation of GaN nanowires grown by plasma-assisted molecular beam epitaxy is studied through a combination of two in situ tools: grazing incidence x-ray diffraction and reflection high energy electron diffraction. Growth on bare Si(111) and on AlN/Si(111) is compared. A significantly larger delay at nucleation is observed for nanowires grown on bare Si(111). The difference in the nucleation delay is correlated to a dissimilarity of chemical reactivity between Al and Ga with nitrided Si(111)