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Reliability screens are used to reduce infant mortality,The quality of the stress test set used during ?he screening process has a direct bearing on the effectiveness of the screen. We have formally studied the problem of computing good quality stress tests for some commonly occurring defects like gate-oxide shorts and interconnect defects. Methods to compute stress tests for gate-oxide defects have been discussed elsewhere. Here we present a formal study of the problem of computing stress tests for interconnect defects.

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