The capacitance of an arbitrarily shaped object is calculated with the same second-kind integral equation method used for computing static and dynamic polarizabilities. The capacitance is simply the dielectric permittivity multiplied by the area of the object and divided by the squared norm of the Neumann-Poincaré operator eigenfunction corresponding to the largest eigenvalue. The norm of this eigenfunction varies slowly with shape thus enabling the definition of two scale-invariant shape factors and perturbative calculations of capacitance. The result is extended to a special class of capacitors in which the electrodes are the equipotential surfaces generated by the equilibrium charge on the object. This extention allows analytical expressions of capacitance for confocal spheroidal capacitors and finite cylinders. Moreover, a second order formula for thin constant-thickness capacitors is given with direct applications for capacitance of membranes in living cells and of supercapacitors. For axisymmetric geometries a fast and accurate numerical method is provided.

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Comments on "Application of the interface capacitance model to thin film relaxors and ferroelectrics" [Appl. Phys.

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The paper presents the application for the first time, to our knowledge, of MEMS devices in the field of high power, high voltage lines. We show how these devices can be used for measuring instantaneous voltage value in real-life industrial conditions. The high voltage MEMS device allows a voltage measurement relative error less than 0,1 % in normal conditions while during a strong earthquake (0,28g soil acceleration -'g' is the gravitational acceleration) it increases to 6 %. We present simulation results and the experimental realization of the optimized sensor model in polymer by using 3D Rapid Prototyping means.