Silicon refractive planar parabolic lenses with minimized absorption were fabricated by a combination of photolithography and dry-etching techniques. Focusing and spectral properties of the lenses were studied with synchrotron radiation in the energy range 8–25 keV at the European Synchrotron Radiation Facility. A focal spot of 1.8 μm with a gain of 18.5 and transmission of more then 80% was measured at 15.6 keV. The spectral characteristics were analyzed taking into account material dispersion and photon-energy attenuation in the hard x-ray range.

No abstract

We report a novel type of x-ray interferometer employing a bilens system consisting of two parallel compound refractive lenses, each of which creates a diffraction limited beam under coherent illumination. By closely overlapping such coherent beams, an interference field with a fringe spacing ranging from tens of nanometers to tens of micrometers is produced. In an experiment performed with 12 keV x rays, submicron fringes were observed by scanning and moiré imaging of the test grid. The far field interference pattern was used to characterize the x-ray coherence. Our technique opens up new opportunities for studying natural and man-made nanoscale materials.

For the first time, single-crystal diamond planar refractive lenses have been fabricated by laser micromachining in 300 µm-thick diamond plates which were grown by chemical vapour deposition. Linear lenses with apertures up to 1 mm and parabola apex radii up to 500 µm were manufactured and tested at the ESRF ID06 beamline. The large acceptance of these lenses allows them to be used as beam-conditioning elements. Owing to the unsurpassed thermal properties of single-crystal diamond, these lenses should be suitable to withstand the extreme flux densities expected at the planned fourth-generation X-ray sources.

To cite this version:A. Snigirev, I. Snigireva, M. Lyubomirskiy, V. Kohn, V. Yunkin, et al.. X-ray multilens interferometer based on Si refractive lenses. Optics Express, Optical Society of America, 2014, 22 (21) Abstract:We report a multilens X-ray interferometer consisting of six parallel arrays of planar compound refractive lenses, each of which creates a diffraction limited beam under coherent illumination. Overlapping such coherent beams produces an interference pattern demonstrating substantially strong longitudinal functional dependence. The interference fringe pattern produced by multilens interferometer was described by Talbot imaging formalism. Theoretical analysis of the interference pattern formation was carried out and corresponding computer simulations were performed. The proposed multilens interferometer was experimentally tested at ID06 ESRF beamline in the X-ray energy range from 10 to 30 keV. The experimentally recorded fractional Talbot images are in a good agreement with computer simulations. Moussaid, and I. Snigireva, "Microradian X-ray diffraction in colloidal photonic crystals," J. Appl. Cryst. 39(2), 137-144 (2006). 14. A. Bosak, I. Snigireva, K. S. Napolskii, and A. Snigirev, "High-resolution transmission X-ray microscopy: a new tool for mesoscopic materials," Adv. Mater. 22(30), 3256-3259 (2010). 15. P. Ershov, S. Kuznetsov, I. Snigireva, V. Yunkin, A. Goikhman, and A. Snigirev, "Fourier crystal diffractometry based on refractive optics," J.