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Spin-on carbon (SOC) materials play an important role in the multilayer lithography scheme for the mass production of advanced semiconductor devices. One of the SOC's key roles in the multilayer process (photoresist, silicon-containing hardmask, SOC) is the reactive ion etch (RIE) for pattern transfer into the substrate. As aspect ratios of the SOC material increase and feature sizes decrease, the pattern transfer from SOC to substrate by a fluorine-containing RIE induces severe pattern deformation ("wiggling"), which ultimately prevents successful pattern transfer into the substrate. One process that reduces line wiggling is a high-temperature (>250°C) post-application bake of the SOC material. In this study, we developed a process for evaluating SOC materials with respect to their pattern transfer performance. This process allowed us to evaluate line-wiggling behavior with several SOC materials at lower bake temperatures. This paper will discuss novel materials design in relation to high-aspect-ratio SOC layers and wiggling resistance.

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Two organic, spin-on BARCs are in the small scale manufacturing phase -with the goal being a 193-nm product optimized for commercialization. Chemistries of the BARCs are shown in this paper and performance of the two products relative to industry accepted needs is discussed. The thermoset BARCs, EXP98O9OB and EXP99001D, are prepared from hydroxyfunctional, dye-aUached acrylic polymers by adding an aminoplast and suffonic acid catalyst. With select 193-nm resists, the BARCs give resolution of L/S pairs down to 0. 12 pm. Plasma etch rates of both BARCs are comparable to those of 193-nm photoresists. Other BARC performance parameters that are discussed for the two products include: film and optical properties, conformality, simulated reflectance curves, spin-bowl compatibility, metals content, and defects.

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