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Plasma wakefield acceleration is a promising technology to reduce the size of particle accelerators. The use of high energy protons to drive wakefields in plasma has been demonstrated during Run 1 of the AWAKE programme at CERN. Protons of energy 400 GeV drove wakefields that accelerated electrons to 2 GeV in under 10 m of plasma. The AWAKE collaboration is now embarking on Run 2 with the main aims to demonstrate stable accelerating gradients of 0.5–1 GV/m, preserve emittance of the electron bunches during acceleration and develop plasma sources scalable to 100s of metres and beyond. By the end of Run 2, the AWAKE scheme should be able to provide electron beams for particle physics experiments and several possible experiments have already been evaluated. This article summarises the programme of AWAKE Run 2 and how it will be achieved as well as the possible application of the AWAKE scheme to novel particle physics experiments.

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A: A low energy beamline has been designed for the TwinEBIS setup. The beamline will be used to transport ions extracted from the electron beam ion source into an accelerating radio frequency quadrupole or into secondary devices, like a time of flight-mass spectrometer, attached to the beamline via a fast three way 20°ion switchyard. Optional injection of ions from an external source into the electron beam ion source is foreseen. In this article the general layout of the beamline is presented and supported with simulations of the ion-optical matching. Furthermore, the switchyard and gridded electrostatic lenses, chosen as the main focusing elements, have been simulated to assess their impact on the beam quality and the dynamics of secondary electrons emitted by the gridded lenses. In addition, the beamline includes general diagnostic devices, including a bidirectional pepperpot beam profiler. An overview of the diagnostic elements is given. K: Accelerator modelling and simulations (multi-particle dynamics; single-particle dynamics); Beam Optics; Beam-line instrumentation (beam position and profile monitors; beamintensity monitors; bunch length monitors); Ion sources (positive ions, negative ions, electron cyclotron resonance (ECR), electron beam (EBIS))1Corresponding author.