Abstract-This paper presents an integrated vibration power generator system. The system consists of a mini electromagnetic vibration power generator and a highly efficient energy harvesting circuit

In-cell touch sensor that can be integrated with display pixel circuit using dual gate InGaZnO thin-film transistor is proposed. Under bottom gate operation, device characteristics are not sensitive to light illumination. On the contrary, light can lead to evident subthreshold leakage when operated with top gate. This behavior allows touch sensor to be realized by sensing the ambient light using top gate operation, without affecting normal bottom gate operated devices in display pixel. Further, the proposed operation method of touch sensor needs no additional fabrication and cost, and even black matrix is not required either.

This letter investigates the effect of temperature on hot-carrier stress-induced degradation behavior in InGaZnO thin film transistors. After hot-carrier stress at 25 °C, serious on-current and subthreshold swing degradations are observed due to trap state generation near the drain side. For identical stress performed at elevated temperatures, current degradation in the I-V transfer curve under reverse mode is gradually suppressed and the anomalous hump in the gate-to-drain capacitance-voltage curve becomes more severe. These suppressed degradations and the more severe hump can be both attributed to hole-trapping near the drain side due to high drain bias at high temperature.

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Characteristics and stress-induced degradation of laser-activated low temperature polycrystalline silicon thin-film transistors