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Amid burgeoning environmental concerns, electrochemical energy storage has rapidly gained momentum. Among the contenders in the "beyond lithium" energy storage arena, the magnesium-sulfur (Mg/S) battery has emerged as particularly promising, owing to its high theoretical energy density. However, the gap between fundamental research and practical application is still hindering the commercialization of Mg/S batteries. Here, through reviewing the recent developments of Mg/S batteries technologies, especially with respect to energy density and cost, we present the primary technical challenges on both materials and device level to surpass the energy density and cost-effectiveness of lithium-ion battery. While the high electrolyte-sulfur ratio and the expensive liquid electrolyte are significantly limiting the practical application of Mg/S batteries, we found that solid-state Mg electrolyte appears to be a feasible solution on the basis of energy density and cost evaluation.

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With the wide recognition that modern nanoscale devices will be error-prone, characterization of reliability of information processing systems built out of unreliable components has become an important topic. In this paper, we analyze the performance of orthogonal matching pursuit (OMP), a popular sparse recovery algorithm, running on faulty circuits. We identify sufficient conditions for correct recovery of the signal support and express these conditions in terms of the relationship among signal magnitudes, sparsity, and the mutual incoherence of the measurement matrix. We study both the effects of additive errors in arithmetic computations and logical errors in comparators. We find that the additive errors in the OMP computations have an impact on the overall performance comparable to that of the additive noise in the input measurements. We also show that parallel structures are more robust to logical errors than serial structures in the implementation of a noisy arg max operation, and thus lead to a better OMP performance.Index Terms-Orthogonal matching pursuit, hardware error resilience, combinational logic, circuit fault tolerance.