The anomalous heating of ions has been a major obstacle for quantum information processing (QIP) based on surface ion trap. Recent results indicated that the adatoms contamination on trap surface can generate contact potential, which gives rise to the fluctuating patch potential. By investigating the contamination from trap surface adatoms induced in loading process, we present the direct physical image of the contamination process and conclude the relationship between the capacitance change and contamination from surface adatoms through the theory and experiment. According to this relationship, the contamination from surface adatoms and the effect of in-situ treatment process can be monitored by the capacitance between electrodes in real time. This paper provides a research method of anomalous heating of ions, which has practicable value to QIP based on surface ion trap.
The surface-electrode ion trap is one of the most promising devices to realize large-scale and integrated quantum information processing. However, a series of problems are faced in the micro-nano fabrication of surface-electrode ion traps. A prominent one is the difficulty to control the thick film surface roughness. A rough electrode surface could produce excessive radio frequency (RF) loss and deteriorate trapping ability of the surface-electrode ion trap. In this paper, a thick film micro-nano fabrication technology to control the surface roughness is presented, which can reduce the roughness of thick film surface-electrode down to 6.2 nm, while being controllable between 6.2 nm and 45 nm. Therefore, it can also provide a basis for studying the influence of electrode surface roughness on trap performance. The micro-nano fabrication technology is not only suitable for surface-electrode ion traps with various configurations, but also be further applied to researches of MEMS, solar cells and surface science.
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