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Background Given the dearth of data regarding the time to treatment initiation (TTI) in the palliative setting, and its impact on survival outcomes, we sought to determine TTI in a real‐world cohort of metastatic colorectal cancer (mCRC) and metastatic pancreatic cancer (mPC) patients and evaluate the impact of TTI on real‐world survival outcomes. Methods We collected survival and treatment data for mCRC and mPC from the Flatiron Health electronic health records (EHR) derived database. We divided TTI into 3 categories: < 2 weeks, 2–< 4 weeks, and 4–8 weeks, from diagnosis to first‐line therapy. Outcome measures were median TTI, real‐world overall survival (RW‐OS) based on TTI categories by Kaplan–Meier method, and impact of TTI on survival using cox proportional hazard models. Results Among 7108 and 3231 patients with mCRC and mPC treated within 8 weeks of diagnosis, the median TTI were 28 days and 20 days. Median RW‐OS for mCRC was 24 months; 26.9 months versus 22.6 and 18.05 months in the 4–8‐week, 2–< 4 week (control) and < 2‐week groups, respectively ( p < 0.0001). For mPC, median RW‐OS was 8 months, without significant difference in RW‐OS among the groups ( p = 0.05). The 4–8‐week group was associated with lower hazard of death (HR 0.782, 95% CI 0.73–0.84, p < 0.0001) and the < 2‐week group was associated with a higher hazard of death (HR 1.26, 95% CI 1.15–1.38, p < 0.0001) in mCRC. The 4–8‐week group was associated with lower hazard of death for mPC (HR 0.88, 95% CI 0.8–0.97, p = 0.0094). Conclusion In a real‐world cohort of patients treated within 8 weeks of diagnosis, and with the limitations of a retrospective study, later TTI did not have a negative impact on survival outcomes in mCRC and mPC.

A novel photosensitive organic material is used as the single organic passivation layer for the conventional back channel etched thin film transistors. We find that the leakage current of the a-Si:H TFTs with single organic passivation layer is lower than that of the conventional transistors with silicon nitride passivation layers and the adhesion strength between the organic layers and the pixel electrode is sufficiently strong so that the overlap between the ITO pixel electrode and the data lines can be formed. Using the novel materials, 1.9" qCIF AMLCD with single organic passivation layer was successfully fabricated with reduced process steps.