Abstract-Magnetic field and temperature dependencies of the critical current density, ( ) were measured by SQUIDmagnetometry, ac magnetic susceptibility, and dc transport current techniques in the single-crystalline epitaxially-grown by offaxis dc magnetron sputtering YBa 2 Cu 3 O 7 (YBCO) films with ( 77 K) 2 10 6 A/cm 2 . The mechanism of vortex depinning from growth-induced linear defects, i.e., out-of-plane edge dislocations in low-angle tilt domain boundaries, is shown to describe quantitatively measured (). The developed model takes into account a statistical distribution of the dislocation domain boundaries ordered in a network as well as the interdislocation spacing within boundaries. Actual structural features of YBCO film known from HREM data turn out to be extracted from ( )-curves by a fitting procedure within the proposed model.
A model for the limiting of the critical current in rather perfect high-Tc superconducting crystals and epitaxial films with a block structure with small angles of misorientation θ of the crystalline blocks is considered for the case when the distance d between edge dislocations along the boundary between blocks is greater than the coherence length ξ(T). It is shown that under these conditions the transparency of low-angle boundaries for the superconducting current carriers near the critical temperature Tc is practically independent of θ and T. As a result, the only factor governing the temperature dependence of the critical current density jc(T) remains the depairing current j0(T)∝(1−T/Tc)3/2. Near Tc, when ξ(T)>d, a transition from the dependence jc(T)∼(1−T/Tc)3/2 to a dependence jc(T)∼(1−T/Tc)2 occurs. This behavior of jc(T) is in good agreement with the results of experimental measurements of the critical currents in thin epitaxial films of YBa2Cu3O7−δ.
Articles you may be interested inFeatures of the temperature dependence and magnetic-field dependence of the critical current density close to the critical temperature in Y Ba 2 Cu 3 O 7 − δ thin films Low Temp.
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