The work considers a two-component holographic optical system having a base element in the form of a thick (volume) hologram optical element and intended for use in a given spectral range. The calculation of a two-component holographic system is carried out using formulas obtained from the mirror-lens model of the thick hologram element proposed by the author. It is indicated that according to the mirror model a thick hologram optical element is achromatic in a first approximation. For this the local period of the volume diffraction structure of the hologram element must be many times greater than the working wavelength, and the transverse dimensions of the element must be less than its thickness. Analytical expressions are given for the mutual correction of the chromatic aberration of the position of a thick hologram optical element and a relief kinoform element. The condition for achromatization of this two-component holographic system is formulated.

Achromatization of a three-component diffraction system consisting of one thick and two thin hologram optical elements is considered in the work. Analytical expressions are obtained for correcting the chromatic aberration of the position of a thick focusing hologram optical element by two scattering thin hologram optical elements in a given spectrum range. It is shown that achromatization is achieved for such a three-component system using two thin hologram elements located symmetrically on both sides of the thick element and having a value of the working diffraction order greater than the ratio of the focal length to the distance from the thin element to the image plane (at a given wavelength). The proposed three-component holographic system can be used to convert both an imaginary image into a real image and a real into an imaginary image in predetermined spectral regions of the visible, ultraviolet or infrared ranges of the spectrum.

The experimental determination of the reflection coefficients in the visible region of the spectrum of chromium oxide films unexposed and exposed to laser radiation was performed. The reflection coefficients were measured using a Linza - 150 spectrophotometer (operating spectrum range from 380 to 1700 nm). The obtained characteristic values of the reflection coefficients of samples of chromium oxide films at different wavelengths are presented in the table and in the form of graphs. It was found that the reflectance of the chromium oxide film before exposure to laser radiation monotonically decreases with increasing wavelength from 380 to 450 nm, with a further increase in wavelength to 630 nm, the reflectance increases monotonically. This work is part of the development of a technique for recording masks by focused laser radiation on multilayer absorbing coatings.

The fifth order axial spherical aberration of a thick diffractive optical element on the example of a hologram optical element (HOE) is analyzed in the paper. Three-component achromatic diffraction system based on the calculated HOE is proposed.

The problem of achromatization of a single volume holographic element is solved in this work by choosing the dispersion coefficients of the material at the stages of recording and use. The condition for achromatization of a single volume holographic element was obtained in this work, namely, the difference in the dispersion coefficients of this element at the stages of use and recording should be inversely proportional to the recording wavelength.