a] The performancep arameterso fe achb est device. [b] The average performance parameter AE standardd eviation for 20 parallel devices.

A simple expression for the yield strength of a thin polycrystalline film attached to a substrate and with a passivated layer has been derived from a relationship between stress work for dislocation moving and strain energy. It is shown that, the yield strength of a polycrystalline film is determined by two affecting factors (orientation of grains and type of dislocations) and three strengthening factors (passivated layer strengthening, substrate strengthening, and grainsize strengthening). Predictions from the expression are in agreement with reported experimental results. This shows that the model is reasonable.

The photovoltaic performance of quasi-solid-state DSSCs depends on the substituent and the substitution site of the imidazolium ring as well.