This paper presents the X-ray micro-CT scanner TOLMI-150-10 developed at Tomsk Polytechnic University. The scanner is used for non-destructive evaluation of materials and industrial samples by means of the X-ray micro-computed tomography (micro-CT). The key technical specifications and design of the scanner are presented in this paper. In addition, a number of examples for non-destructive evaluation are given. Recent results, obtained using the TOMLI system, are compared with those acquired with an existing commercial tomographic imaging solution.

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