GaN bulk rectifiers show excellent on-state resistances ͑in the m⍀ cm Ϫ2 range͒, forward turn-on voltages of ϳ1.8 V and reverse-recovery times of Ͻ50 ns. A key requirement is to develop effective edge termination techniques in order to prevent premature surface-induced breakdown. We have performed a simulation study of the effects of varying the dielectric passivation material (SiO 2 , SiN x , AlN, Sc 2 O 3 , or MgO͒, the thickness of this material, the extent of metal overlap onto the dielectric and the ramp oxide angle on the resulting reverse breakdown voltage (V B ) of bulk rectifiers. We find that SiO 2 produces the highest V B of the materials investigated, that there is an optimum metal overlap distance for a given oxide thickness and small oxide ramp angles produce the highest V B .