“…Increasing the device breakdown voltage means that the device can operate at higher voltages and thus, keeping constant the device current, higher output power levels. The second one is instead related to a reduction of a parasitic effect which is called DC-to-RF dispersion or drain current-collapse (Asano et al, 1998, Ando et al,2003Chini et al, 2004;Chini et al, 2008). When the device is affected by this phenomenon, drain current levels reached during RF operation are lower than those recorded during DC measurements.…”