Comprehensive Energy Systems 2018
DOI: 10.1016/b978-0-12-809597-3.00214-5
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2.4 Thin Films

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Cited by 6 publications
(3 citation statements)
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“…Thin films are-due to their numerous applications, for example, as reflection and antireflection coatings, for corrosion protection, as hard discs for video or audio tapes, and in piezoelectric devices-one major focal point in materials science. [1][2][3] Of course, many materials properties that make thin metallic or alloyed films perfect for certain applications such as hardness and strength depend on the grain size of the microstructure-just as in their polycrystalline bulk counterparts. However, it is particularly interesting to note that due to the reduction in respect to the third dimension, thin films are often characterized by properties different than the corresponding bulk material.…”
Section: Introductionmentioning
confidence: 99%
“…Thin films are-due to their numerous applications, for example, as reflection and antireflection coatings, for corrosion protection, as hard discs for video or audio tapes, and in piezoelectric devices-one major focal point in materials science. [1][2][3] Of course, many materials properties that make thin metallic or alloyed films perfect for certain applications such as hardness and strength depend on the grain size of the microstructure-just as in their polycrystalline bulk counterparts. However, it is particularly interesting to note that due to the reduction in respect to the third dimension, thin films are often characterized by properties different than the corresponding bulk material.…”
Section: Introductionmentioning
confidence: 99%
“…In addition, the peak positions in the I 3d spectra of all films are significantly different, indicating distinct interactions between different metal oxide and THP perovskite crystals (Figure S5). The four-probe method is used to measure the surface resistivity/electrical conductivity of the semiconductor. , In the measurement protocol adapted in this work, the four-probe method and the XPS method both assist the surface property. Therefore, the electrical conductivity and the Sn­(IV) amount can be correlated.…”
Section: Resultsmentioning
confidence: 99%
“…The four-probe method is used to measure the surface resistivity/electrical conductivity of the semiconductor. 37,38 In the measurement protocol adapted in this work, the four-probe method and the XPS method both assist the surface property. Therefore, the electrical conductivity and the Sn(IV) amount can be correlated.…”
Section: ■ Results and Discussionmentioning
confidence: 99%