14th IEEE International Conference on Nanotechnology 2014
DOI: 10.1109/nano.2014.6968182
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300 V integrated charge pump for lab on chip applications

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Cited by 5 publications
(1 citation statement)
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“…Although charge pumps based on non-transistor components such as poly-silicon diodes have been proposed, their maximum voltages are still less than 50 V [37]. To obtain higher voltage endurance, the earlier reported HV generators (up to 300 V) used the lateral-diffused MOS (LDMOS) transistors [38] in HV CMOS technology, which exhibit high breakdown voltage up to 750 V [39]- [41]. However, these HV transistors also have high threshold voltages.…”
Section: Designmentioning
confidence: 99%
“…Although charge pumps based on non-transistor components such as poly-silicon diodes have been proposed, their maximum voltages are still less than 50 V [37]. To obtain higher voltage endurance, the earlier reported HV generators (up to 300 V) used the lateral-diffused MOS (LDMOS) transistors [38] in HV CMOS technology, which exhibit high breakdown voltage up to 750 V [39]- [41]. However, these HV transistors also have high threshold voltages.…”
Section: Designmentioning
confidence: 99%