2018
DOI: 10.1016/j.fusengdes.2018.03.019
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3D modelling of tungsten fuzz growth under the bombardment of helium plasma

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Cited by 16 publications
(7 citation statements)
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“…However, under low-energy helium plasma exposure, with incident ion energies higher than a threshold value of 35 eV [5][6][7], and a temperature range very similar to the conditions expected at the divertor wall of ITER, a fragile nanofiber-like crystalline structure grows on the tungsten surface [5][6][7][8][9][10][11]; this nanostructure, known as 'fuzz', poses a major operational challenge in ITER [8][9][10][11]. Over the past two decades, several theoretical [12][13][14] and simulation [15][16][17][18][19][20][21][22] studies have attempted to decipher and elucidate the mechanism of fuzz formation. In our previous studies, we identified stress-driven surface diffusion as the primary driving force for nanotendril growth at the early stage of plasma exposure, where the stress is developed in the nearsurface layer of plasma-facing component (PFC) tungsten due to over-pressurized nanometer-size bubbles formed by the implanted helium ions in the PFC material.…”
Section: Introductionmentioning
confidence: 99%
“…However, under low-energy helium plasma exposure, with incident ion energies higher than a threshold value of 35 eV [5][6][7], and a temperature range very similar to the conditions expected at the divertor wall of ITER, a fragile nanofiber-like crystalline structure grows on the tungsten surface [5][6][7][8][9][10][11]; this nanostructure, known as 'fuzz', poses a major operational challenge in ITER [8][9][10][11]. Over the past two decades, several theoretical [12][13][14] and simulation [15][16][17][18][19][20][21][22] studies have attempted to decipher and elucidate the mechanism of fuzz formation. In our previous studies, we identified stress-driven surface diffusion as the primary driving force for nanotendril growth at the early stage of plasma exposure, where the stress is developed in the nearsurface layer of plasma-facing component (PFC) tungsten due to over-pressurized nanometer-size bubbles formed by the implanted helium ions in the PFC material.…”
Section: Introductionmentioning
confidence: 99%
“…The SURO-FUZZ program was originally developed to simulate the formation of tungsten fuzz under helium ion bombardment [31]. However, physical processes such as helium migration and agglomeration, helium bubble growth and rupture and so on during tungsten fuzz growth are very time-consuming to simulate [40,41].…”
Section: Suro-fuzzmentioning
confidence: 99%
“…In this work, modelling of the hydrogen reflection coefficient on the tungsten fuzzy surface has been performed by SURO-FUZZ [31]. SURO-FUZZ was developed based on the 3D rough surface code SURO, which was originally developed to study the influence of surface roughness on impurity erosion and deposition characteristics in fusion experiments [32][33][34].…”
Section: Introductionmentioning
confidence: 99%
“…Under such conditions, tungsten readily forms a fragile crystalline nanotendril-like structure, commonly called 'fuzz' [6][7][8][9][10][11][12]; formation of nanotendrils emanating from the PFC surface constitutes a precursor to the growth of fuzz, a surface layer consisting of such interconnected nanotendrils with complex morphological features. Over the last two decades, a number of theoretical [13][14][15], simulation [16][17][18][19][20][21][22][23], and experimental [6,10,24,25] studies have been conducted to decipher the intriguing physics/mechanism of fuzz formation because, if it remains unmitigated, the fragile fuzz of the high-Z tungsten (W) can be exfoliated and released into the plasma and, thus, severely compromise the performance of the reactor [9][10][11][12]. Helium has a very low solubility in tungsten; as a result, upon implantation, He atoms readily self-cluster and nucleate helium bubbles, which subsequently grow by absorbing helium and emitting tungsten Frenkel pairs, a process known as the 'trap-mutation' reaction [24,26].…”
Section: Introductionmentioning
confidence: 99%