2001
DOI: 10.1109/4.910493
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5.5-V I/O in a 2.5-V 0.25-μm CMOS technology

Abstract: A robust high-voltage-tolerant I/O that does not need process options is presented, demonstrated on 5.5-V-tolerant I/O in a 2.5-V 0.25-m CMOS technology. Circuit techniques limit oxide stress and hot-carrier degradation. Measurements on realized circuits, under accelerated stress conditions, indicate an extrapolated lifetime of hundreds of years for 5.5-V pad voltage swing, 2.2-V supply voltage. The shown concepts can easily be scaled toward newer processes or other interfacing voltages.

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Cited by 111 publications
(47 citation statements)
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“…The most common way to extend the tolerable supply voltage using low-voltage CMOS technology is to use the cascode or stacked transistor structure [77], [78], which in combination with thick-oxide transistors allows operation at higher supply voltage while keeping reliability at a high level. The result is higher output power, higher load, and lower current, which potentially leads to lower losses and higher efficiency.…”
Section: Circuit Solutionsmentioning
confidence: 99%
“…The most common way to extend the tolerable supply voltage using low-voltage CMOS technology is to use the cascode or stacked transistor structure [77], [78], which in combination with thick-oxide transistors allows operation at higher supply voltage while keeping reliability at a high level. The result is higher output power, higher load, and lower current, which potentially leads to lower losses and higher efficiency.…”
Section: Circuit Solutionsmentioning
confidence: 99%
“…3b) [10]. While this implementation is more reliable, the speed is limited by the three series transistor stack and feedback tracking loops.…”
Section: Mqwm Transmittermentioning
confidence: 99%
“…To solve the gate-oxide reliability issue without using the additional thick gate oxide process (also known as dual gate oxides in some CMOS processes [5], [6]), the stacked-MOS configuration has been widely used in the mixed-voltage I/O buffers [7]- [12], and in the power-rail ESD clamp circuits [13]. The typical 3-V/5-V-tolerant mixed-voltage I/O circuit is shown in Fig.…”
Section: Introductionmentioning
confidence: 99%