The possibility to grow CdZnSSe quantum structures with a high structural quality is extremely important for light emitting devices in the blue-green spectral range. However, during device operation the degradation of the quantum well reduces the lifetime severely due to the formation of dark spot and dark line defects, which are not clearly understood. To investigate the mechanisms of defects formation degradation studies were performed for ZnSe-based laser diodes with quaternary CdZnSSe quantum well structures by means of electroluminescence, high-resolution X-ray diffraction and transmission electron microscopy. It was found that the degradation is closely connected to a blue shift of the emitted light and the formation of defects which are confined near to the quantum well. A partial broadening of the quantum well could be observed, which is attributed to the outdiffusion of Cd from the active region. 1 Introduction Blue-green light emitting ZnSe-based laser diodes (LDs) have been studied intensively for more than ten years. However, a breakthrough for a reliable technology on this material is hampered by the lack of long-term stability of these devices [1]. Apart from the reduction of stacking faults density, their degradation has been related to two factors: firstly, problems connected with the nitrogen doping used to obtain p-type conductivity (nitrogen related deep complex centers act as efficient nonradiative centers during operation) [2,3] and secondly, the instability of the quantum well (QW) during operation, which is regarded to be the main obstacle for the application of II-VI materials for light emitters. The gradual decrease of the output intensity in the ZnSe-based LD during operation can be related to an occurrence of dark spots and dark line defects [4], but microstructural investigations of the defect formation mechanisms are rare and not really conclusive [5,6].This work reports on the microstructural changes in the active region of the device due to the quantum well degradation. The combination of electroluminescence (EL) measurements, used to analyze the output intensity and peak wavelength of the device, and microstructural sensitive methods comprising high resolution X-ray diffraction (HRXRD), as well as transmission electron microscopy (TEM), provides a clearer picture of the device degradation process.