800 X 800 Charge-Coupled Device Image Sensor

Blouke, Morley M.; Janesick, James R.; Hall, Joseph E.; Cowens, M. W.; May, P. J.

doi:10.1117/12.7973205

Cited by 30 publications

(13 citation statements)

References 1 publication

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“…The video camera is provided with a charge coupled device (CCD) sensor (Blouke et al 1983;Donovan and Goldstein 1985;Aikens et al 1989). The CCD is subdivided into thousands of tiny square or rectangular potential wells (6-15 µm side) each behaving as an independent true photometric unit which transforms single photons in photo electrons.…”

Section: Dna Image Cytometrymentioning

confidence: 99%

The Feulgen reaction 75 years on

Chieco

Derenzini²

1999

Histochemistry and Cell Biology

103

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The Feulgen reaction proposed by Feulgen and Rossenbeck 75 years ago is one of the cytohistochemical reactions most widely used in biology and medicine. It allows DNA in situ to be specifically stained based on the reaction of Schiff or Schiff-like reagents with aldehyde groups engendered in the deoxyribose molecules by HCl hydrolysis. The staining intensity is proportional to the DNA concentration. Current applications of the Feulgen reaction are mainly concerned with DNA quantification in cell nuclei by image cytometry for ploidy evaluation in tumor pathology. From the morphological point of view, specific demonstration of DNA in cell structures at the light microscopic level is very little used nowadays. On the other hand, application of the Feulgen principles to electron microscopy have recently allowed specific DNA-staining procedures to be developed for the study of the structural organization of DNA in situ.

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Section: Dna Image Cytometrymentioning

confidence: 99%

The Feulgen reaction 75 years on

Chieco

Derenzini²

1999

Histochemistry and Cell Biology

103

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“…Tests of coated devices indicate that the material responds to 57nm, well below the Lyman alpha cutoff. As a serendipity, the thin layer of Coronene (~100-130 nm) acted as a surprisingly good anti-reflection coating [1,2].…”

Section: Wf/pc Imentioning

confidence: 99%

The Hubble CCDs: Lessons learned

Blouke¹,

Bredthauer²,

Janesick³

2005

SPIE Proceedings

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There is little doubt that the Hubble Space Telescope is one of the most important astronomical instruments of the late 20 th and early 21 st centuries. Spectacular imagery has been sent back to earth-bound observers leading to a much greater understanding and appreciation of the universe around us. Much of this ability to image has been due to an extraordinary detector: the charge-coupled device (CCD). The intent of this paper is to review the history of the CCDs that have been employed on Hubble and consider some of the lessons learned.

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“…The raw signal image output from a solid state imager includes two kinds of noises; random noise and fixed-pattern noises [9]. The random noise in SCAPS imaging is composed of read noise, shot noise and reset noise.…”

Section: Definition Of Scaps Noisementioning

confidence: 99%

Noise characteristics of stacked CMOS active pixel sensor for charged particles

Kunihiro

Nagashima

Takayanagi

et al. 2001

Nuclear Instruments and Methods in Physics Research Section A:

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The noise characteristics of a stacked CMOS active pixel sensor (SCAPS) for incident charged particles have been analyzed under 4.5 keV Si + ion irradiation. The source of SCAPS dark current was found to change from thermal to electron leakage with decreasing device temperature. Leakage current at charge integration part in a pixel has been reduced to 0.1 electrons s À1 at 77 K. The incident ion signals are computed by subtracting reset frame values from each frame using a non-destructive readout operation. With increase of irradiated ions, the dominant noise source changed from read noise, and shot noise from the incident ions, to signal frame fixed-pattern noise from variations in sensitivity between pixels. Pixel read noise is equivalent to ten incident ions. The charge of an incident ion is converted to 1.5 electrons in the pixel capacitor. Shot noise corresponds to the statistical fluctuation of incident ions. Signal frame fixed-pattern noise is 0.7% of the signal. By comparing full well conditions to noise floor, a dynamic range of 80 dB is achieved. SCPAS is useful as a two-dimensional detector for microanalyses such as stigmatic secondary ion mass spectrometry. #

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800 X 800 Charge-Coupled Device Image Sensor

Cited by 30 publications

References 1 publication

The Feulgen reaction 75 years on

The Feulgen reaction 75 years on

The Hubble CCDs: Lessons learned

Noise characteristics of stacked CMOS active pixel sensor for charged particles

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