Absfract-This paper presents a memory architecture with the capability of self-testing and self-repairing. The contributions of this memory architecture are twofold. Firstly, it incorporates selftesting and self-repairing structures in the memory. As a result, the memory chips can perform tests, locate faults, and repair itself without any external assistance from either test engineers or test equipment, This will drastically improve the functional yield and reduce the production cost, Secondly, the proposed memory architecture uses a hierarchical organization to achieve optimal conditions for memory access time. The hierarchical organization also helps increase the efficiency of the self-testing and self-repairing structures.