A 3.6 gigasample/s 5 bit analog to digital converter using 0.3 /spl mu/m AlGaAs-HEMT technology

Oehler, F.; Sauerer, J.; Hagelauer, R.; Seitzer, D.; Nowotny, U.; Raynor, B.; Schneider, J.

doi:10.1109/gaas.1993.394478

Cited by 9 publications

(2 citation statements)

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“…The comparator was measured to have a dynamic sensitivity of 5 mV at 2 GHz, equal to a recent all-transistor circuit [4], while reducing the component count by 75%. Our RTD-HFET comparator has been used to implement a 4-bit 2 GSpj resonant tunneling analog-to-digital converter, which will be reported elsewhere [5].…”

Section: -2mentioning

confidence: 99%

“…To remove the reset clock, the output of the comparator core is fed into a RTD-pair latch that is only allowed to sample the signal out-of-phase with the reset clock; the latch therefore removes the clock from the signal. This circuit achieves a significant reduction (75%) in component count over all-transistor comparator circuits [4]. Subcircuits of these two stages were tested independently, and functioned as described.…”

Section: Device Fabrication/ Circuit Testingmentioning

confidence: 99%

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3 GHz resonant tunneling clocked comparator

Brar

Broekaert²,

Wagt³

et al. 1997

Proceedings IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits CORNEL-97

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The combination of resonant tunneling diodes (RTDs) and heterostructure fieid-effect transistors (HFETs) provides a versatile technology for designing ultra-hgh-speed analog and digital circuits. Here we demonstrate an RTD-KFET comparator circuit that operates up to 3 GHz clock frequency. The RTD based comparator allows us to employ 75% fewer devices than all-transistor comparators. The circuit is measured to have a single-tone spurfree-dynamic range of at least 40 dB and a sensitivity of 5 mV at a 2 GHz clock.

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Section: -2mentioning

confidence: 99%

Section: Device Fabrication/ Circuit Testingmentioning

confidence: 99%