Embedded DRAMs have superior features for applications that require very high memory bandwidth, such as graphics and multimedia. To achieve high memory bandwidth, various techniques such as widening input/output pins [1], shrinking the unit array size [2], and performing a read operation and a write operation concurrently [3,4] have been reported. However, these embedded DRAM macros incur considerable area penalty to obtain high memory bandwidth. Figure 14.4.1 shows the cell efficiency versus the memory bandwidth of the macros reported recently. Among the techniques for achieving high bandwidth, the concurrent read/write operation is a very effective method in performing a read-modify-write function and a double-buffer function for the graphics applications. We describe a pseudo-two-port embedded DRAM macro that performs concurrent read/write operations at high frequency without sacrificing cell efficiency. To accomplish this, we introduce, a read/write cross-point switch circuit (RWCC) and distributed steering redundancy switches (DSRS). A 32Mb macro is characterized via a test-chip fabricated in a 65nm embedded DRAM process. We confirm page-mode operating frequency of 833MHz at 1.2V.In the previous work [3,4], in order to realize the concurrent read/write operation, the data lines connecting sense amplifies and input/output circuits are separated into read path and write path. Since this requires additional switches for each sense amplifier, the area overhead of the sense amplifier region is considerable. This decreases the cell efficiency of the macros.Our pseudo-two-port embedded DRAM macro performs a read operation and a write operation concurrently in two different banks. Figure 14.4.2 shows the block diagram of the DRAM macro. A read/write cross-point switch circuit (RWCC) is placed between two adjacent banks. The RWCC consists of 2 nd sense amplifiers (R), write buffers (W), and data path switches. Local read/write data lines (LRWD) are bidirectional data lines in a bank, and global data lines are separated into read path (GRD) and write path (GWD). The RWCC controls connections between GRD/GWD and LRWD according to the address for bank selection and the read/write commands. In this way, the read data from a bank do not collide with the write data to the other bank on the data path. Therefore, the concurrent read/write operation can be performed in different two banks. Since bidirectional data lines in a bank are used in a similar way to a conventional single-port DRAM, the area penalty for the sense amplifier region is eliminated. The macro area overhead for the concurrent read/write operation is less than 1%. Each of the two input ports has a full set of inputs for the address and the control signals for read, write, active, and precharge. The addresses and the commands are independently asserted for each port. Only simultaneous read and simultaneous write command inputs from the two ports are prohibited. During continuous read operations in a bank, write commands are asserted independently to another b...