A 60 Ghz Scanning Near-Field Microscope With High Spatial Resolution Sub-Surface Imaging

Haddadi, Kamel; Glay, D.; Lasri, T.

doi:10.1109/lmwc.2011.2167744

Cited by 38 publications

(10 citation statements)

References 9 publications

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“…The main measurement limitation in microwave microscopy applications is the impedance mismatch between the intrinsic impedance of the network analyzer close to 50Ω and the impedance of evanescent microwave probes (EMP) that is in the range of tens or hundreds kΩ [7]- [11]. As illustrated in Fig.…”

Section: A Principle Of Operationmentioning

confidence: 99%

Near-field microwave microscopy for liquid characterization

Haddadi

Lasri

2014

2014 44th European Microwave Conference

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A near-field microwave microscopy platform for the characterization of liquids is proposed. The technique is based on the association of a network analyzer and an evanescent microwave coaxial probe. The major feature of the system proposed is the development of a broadband tunable matching network inserted between the test port of the network analyzer and the probe. The tunable matching network based on microwave interferometry gives the possibility to achieve a strong electromagnetic coupling between the probe tip and the liquid in the range 1-20 GHz. As a demonstration, the monitoring of the evaporation of small volumes of liquids shows that he system is considerably sensitive to any microscopic level change of liquid volume.

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Section: A Principle Of Operationmentioning

confidence: 99%

Near-field microwave microscopy for liquid characterization

Haddadi

Lasri

2014

2014 44th European Microwave Conference

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“…The wide dimension of the slit is set to the WR-15 standard (3.76 mm), but the waveguide height is tapered down to 160 μm (∼λ/30). One can note that a resonant structure is not needed to improve the transmission efficiency in contrast with evanescent probes that operate below the cutoff frequency [6].…”

Section: Microscope Configurationmentioning

confidence: 99%

60-GHz Near-Field Six-Port Microscope Using a Scanning Slit Probe for Subsurface Sensing

Haddadi

Lasri

2012

IEEE Sensors J.

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A new six-port based near-field millimeter-wave microscope using a scanning slit probe is proposed for subsurface sensing applications. The combination of a six-port reflectometer and a slit probe presents a viable and promising alternative to the costly heterodyne principle. The system presents advantages such as compactness, robustness, and low cost. To evaluate its performance, the spatial resolution is experimentally verified.Index Terms-Near-field millimeter-wave microscopy, six-port, slit probe, subsurface.

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“…However, there are fewer research results for short-range MMW imaging applications, especially less than hundreds of centimeters. Previous works have demonstrated capacities for obtaining high resolution images at close range [5][6][7][8]. The focal plane array (FPA) technology is useful due to the high frame rate of the MMW imaging system at the expense of the cost of large area arrays [9][10][11][12].…”

Section: Introductionmentioning

confidence: 99%

Characteristic analysis of aspheric quasi-optical lens antenna in millimeter-wave radiometer imaging system

et al. 2013

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Quasi-optical imaging systems require low blurring effect and large depth of focus (DOF) to get an acceptable sharpness of the image. To reduce aberration-limited blurring, the aspheric convex plano lenses with an aperture diameter of 350 mm are designed in W-band. We analyzed theoretically and experimentally the millimeter-wave band lens characteristics, such as beam spot size, spatial resolution (SR), and DOF, via f-number. It is first used to verify the DOF through f-number in the system-level test with the developed W-band radiometer imaging system. We have confirmed that the larger f-number of quasi-optical lens leads to a larger DOF but a lower SR.

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A 60 Ghz Scanning Near-Field Microscope With High Spatial Resolution Sub-Surface Imaging

Cited by 38 publications

References 9 publications

Near-field microwave microscopy for liquid characterization

Near-field microwave microscopy for liquid characterization

60-GHz Near-Field Six-Port Microscope Using a Scanning Slit Probe for Subsurface Sensing

Characteristic analysis of aspheric quasi-optical lens antenna in millimeter-wave radiometer imaging system

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