IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)
DOI: 10.1109/epep.2001.967627
|View full text |Cite
|
Sign up to set email alerts
|

A broad band Through-Line-Line de-embedding technique for BGA package measurements

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Publication Types

Select...
2
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 1 publication
0
1
0
Order By: Relevance
“…9(a), need to be de-embedded. The thru-lineline (TLL) calibration technique [20] was applied for this purpose. Fig.…”
Section: Measurement Results and Discussionmentioning
confidence: 99%
“…9(a), need to be de-embedded. The thru-lineline (TLL) calibration technique [20] was applied for this purpose. Fig.…”
Section: Measurement Results and Discussionmentioning
confidence: 99%