A built-in supply current test circuit for pin opens in assembled PCBs

Umezu, Shoichi; Hashizume, Masaki; Yotsuyanagi, Hiroyuki

doi:10.1109/icep.2014.6826694

Cited by 3 publications

(3 citation statements)

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“…Once the FET transistor is open, that is, it"s disconnected from the circuit, the circuit doesn"t oscillate. By injecting short faults within the circuit, the FET transistor operates within the cutoff region, as exhibited in figure (8 Here, all possible faults represent the have not been thoughtabout. For the faults thought-about, 100 percent fault coverage was achieved.…”

Section: Fig 6: Phase Shift Oscillator In Test Modementioning

confidence: 99%

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Analog and Mixed Signal Test Method based on OBIST Technique

KumarOjha¹,

Akashe²

2015

IJCA

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This paper describes a test method for analog and mixed signal device at very low cost and it"s based on OBIST (oscillation test) method. This method is built-in self test method appropriate for functional and structural testing of analog and mixed signal circuit. In test mode, the test circuit is converted into an oscillator. Then faults inside the test circuit that cause an affordable deviation of the oscillation frequency from its value are detected. Through this test method, no test vector is required to apply. Therefore in this test technique, the test vector generation drawbacks are eliminated and also the test time is reduced because limited number of oscillation frequencies is evaluated for each test circuit. This characteristic implies that Oscillation-test methodology is very attractive for further wafer-probe testing as final production testing. During this paper, the simulation results of this test method has been provided and verified throughout some examples like CMOS inverter and FET (field effect transistor).

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Section: Fig 6: Phase Shift Oscillator In Test Modementioning

confidence: 99%

“…As a result of BIST this mechanism allows a machine to check itself. A BIST mechanism is provided in advanced field bus systems to verify its functionality [8][9]. It reduces the test-cycle period.…”

Section: Fig 2: Typical Bist Structurementioning

confidence: 99%

Analog and Mixed Signal Test Method based on OBIST Technique

KumarOjha¹,

Akashe²

2015

IJCA

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“…Various circuit variables (e.g., voltage, current, and frequency) have been used in fault dictionary to obtain fault signatures [6][7][8]. In addition to the commonly employed measurement of output voltage, supply current testing has been applied widely in analog and mixed signal integrated circuits (ICs) with excellent fault coverage, especially for the catastrophic fault of CMOS ICs [9][10][11].…”

Section: Introductionmentioning

confidence: 99%

Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage

Tian²,

Guo³

2015

Journal of Applied Mathematics

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This paper deals with the modeling of fault for analog circuits. A two-dimensional (2D) fault model is first proposed based on collaborative analysis of supply current and output voltage. This model is a family of circle loci on the complex plane, and it simplifies greatly the algorithms for test point selection and potential fault simulations, which are primary difficulties in fault diagnosis of analog circuits. Furthermore, in order to reduce the difficulty of fault location, an improved fault model in threedimensional (3D) complex space is proposed, which achieves a far better fault detection ratio (FDR) against measurement error and parametric tolerance. To address the problem of fault masking in both 2D and 3D fault models, this paper proposes an effective design for testability (DFT) method. By adding redundant bypassing-components in the circuit under test (CUT), this method achieves excellent fault isolation ratio (FIR) in ambiguity group isolation. The efficacy of the proposed model and testing method is validated through experimental results provided in this paper.

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