A robust 0.1‐µm GaN high electron mobility transistor (HEMT) technology is developed for high‐speed mixed‐signal circuits of considerable complexity. The baseline 0.1‐µm depletion‐mode HEMT exhibits a peak cut‐off frequency of 100 GHz and a peak maximum oscillation frequency of 165 GHz. A 501‐stage monolithically integrated enhancement/depletion‐mode ring oscillator incorporating 1006 GaN HEMTs is demonstrated with a low propagation delay of 7.3 ps/stage, verifying the uniformity and high performance of the devices. For the first time, a 16 GS/s 3‐bit digital‐to‐analog converter (DAC) core using GaN technology is implemented. A static output voltage swing as large as 1.5 V is achieved, validating the advantage of GaN technology for use in large‐dynamic‐range circuits.