A comprehensive approach for modeling and testing analog and mixed-signal devices

Souders, T. M.; Stenbakken, Gerard N.

doi:10.1109/test.1990.114015

Cited by 60 publications

(17 citation statements)

References 4 publications

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“…The training data can be denoted by a matrix , where represents the index for the CTs and represents the indices of the ADCs. The mean CTs are estimated using (4) and the matrix is determined using a principal component analysis of . An efficient way to do this would be to subtract the mean transition levels from the measured transitions as , and then perform a singular-value decomposition of the resulting matrix .…”

Section: Use Of Linear Models In Adc Testingmentioning

confidence: 99%

Optimal linearity testing of analog-to-digital converters using a linear model

Cherubal¹,

Chatterjee

2003

IEEE Trans. Circuits Syst. I

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To maintain an acceptable level of quality in the production of analog-to-digital converters (ADCs), the linearity metrics of every ADC has to be measured and checked against performance specification limits. As ADCs continue to improve in resolution, their testing has becoming increasingly demanding in terms of test time. In this paper, we demonstrate a technique for reducing the test time for ADCs. The technique is shown to be significantly better than currently available techniques and can be easily integrated into current production test methodologies. Experimental results in simulation and on actual hardware are shown to demonstrate the technique.Index Terms-Analog-to-digital converter (ADC) linearity test, linear model, statistical modeling.

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Section: Use Of Linear Models In Adc Testingmentioning

confidence: 99%

Optimal linearity testing of analog-to-digital converters using a linear model

Cherubal¹,

Chatterjee

2003

IEEE Trans. Circuits Syst. I

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“…If further test-points are desired to improve accuracy, it is a good idea to augment with the row of corresponding to the maximum prediction variance [14]. This can be repeated until the maximum prediction variance is sufficiently low.…”

Section: Choice Of : Which Test-points?mentioning

confidence: 99%

A rigorous exposition of the LEMMA method for analog and mixed-signal testing

Wrixon

Kennedy

1999

IEEE Trans. Instrum. Meas.

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“…Linear modeling approaches were proposed to reduce the test complexity and shorten the test time [4,5]. On chip test functions were designed to eliminate the need for external testers [6].…”

Section: Introductionmentioning

confidence: 99%

An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli

Jin

Chen

et al.

2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512)

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Analog and mixed-signal test is identified as one of the most daunting challenges for system-on-a-chip design. The bottleneck of mixed-signal test is the instrumentation of high precision signal generators and response measurement devices. This paper provides a cost-effective solution to the mixed-signal test problem by using lowaccuracy but easy-to-generate stimuli instead of accurate signals generated by very expensive testers. We take the ADC linearity test as a vehicle to study the performance of the proposed approach. A low-linearity sine wave and an attenuated copy of the sine wave are used in the histogram test for an ADC. A stimulus error identification and removal algorithm is derived such that the ADC's linearity can be accurately determined without being affected by the sine wave's non-linearity. Simulation results show that 16-bit test accuracy can be achieved by using sine waves with a 38-dB SFDR, corresponding to a 6-bit linearity. This approach is applicable to test fully differential ADCs and extendable to other mixed-signal functions of IC products.

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A comprehensive approach for modeling and testing analog and mixed-signal devices

Cited by 60 publications

References 4 publications

Optimal linearity testing of analog-to-digital converters using a linear model

Optimal linearity testing of analog-to-digital converters using a linear model

A rigorous exposition of the LEMMA method for analog and mixed-signal testing

An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli

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